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British Standards for 31.080.01 Semiconductor devices in general | Module: ICS 31.080.01

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

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BS IEC 796-1:1990
Microprocessor system bus. 8-bit and 16-bit data MULTIBUS I Functional description with electrical and timing specifications
SKU/ISBN:0580193462

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BS 3934-5:1997
Mechanical standardization of semiconductor devices Recommendations applying to tape automated bonding (TAB) of integrated circuits
SKU/ISBN:0580278123

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BS EN 153000:1998
Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval)
SKU/ISBN:0580302067

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PD ES 59008-5-2:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die with added connection structures
SKU/ISBN:0580376923

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PD ES 59008-5-1:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Bare die
SKU/ISBN:0580376915

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PD ES 59008-4-1:2001
Data requirements for semiconductor die. Specific requirements and recommendations Test and quality
SKU/ISBN:0580369722

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BS 7241:1989
Specification for IEC 822 VSB: parallel sub-system bus of the IEC 821 VME bus
SKU/ISBN:058018093X

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BS EN 60191-6-8:2001
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages Design guide for glass sealed ceramic quad flatpack (G-QFP)
SKU/ISBN:0580386775

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PD ES 59008-6-2:2001
Data requirements for semiconductor die. Exchange data formats and data dictionary Data dictionary
SKU/ISBN:0580375404

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BS EN 60191-6-3:2001
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages Measuring methods for package dimensions of quad flat packs (QFP)
SKU/ISBN:058037243X

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BS EN 60191-6-5:2001
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages Design guide for fine-pitchball grid array (FBGA)
SKU/ISBN:0580386651

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BS EN 60191-6-4:2003
Mechanical standardization of semiconductor devices. General rules for the preparation of outline drawings of surface mounted semiconductor device packages Measuring methods for package dimensions of ball grid array (BGA)
SKU/ISBN:0580423565

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PD ES 59008-5-3:2001
Data requirements for semiconductor die. Particular requirements and recommendations for die types Minimally-packaged die
SKU/ISBN:0580387445

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BS IEC 60747-14-4:2011
Semiconductor devices. Discrete devices Semiconductor accelerometers
SKU/ISBN:9780580556654

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BS IEC 60747-16-2:2001
Semiconductor devices Microwave integrated circuits. Frequency prescalers
SKU/ISBN:9780580608827

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BS EN 60191-6-17:2011
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages. Design guide for stacked packages. Fine-pitch ball grid array and fine-pitch land grid ar..
SKU/ISBN:9780580576218

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BS IEC 60747-14-5:2010
Semiconductor devices Semiconductor sensors. PN-junction semiconductor temperature sensor
SKU/ISBN:9780580588099

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BS IEC 60747-14-1:2010
Semiconductor devices Semiconductor sensors. Generic specification for sensors
SKU/ISBN:9780580629006

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BS IEC 60747-1:2006+A1:2010
Semiconductor devices General
SKU/ISBN:9780580682179

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BS QC 750100:1986+A2:1996
Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Sectional specification
SKU/ISBN:9780580692093

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BS IEC 62483:2013
Environmental acceptance requirements for tin whisker susceptibility of tin and tin alloy surface finishes on semiconductor devices
SKU/ISBN:9780580788284

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BS EN 60191-6-10:2003
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages
SKU/ISBN:0580436136

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BS EN 61582:2006
Radiation protection instrumentation. In vivo counters. Classification, general requirements and test procedures for portable, transportable and installed equipment
SKU/ISBN:0580484793

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BS EN 60191-6:2009
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages
SKU/ISBN:9780580593383

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BS EN 60191-6-19:2010
Mechanical standardization of semiconductor devices Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage
SKU/ISBN:9780580607585

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BS EN 62415:2010
Semiconductor devices. Constant current electromigration test
SKU/ISBN:9780580618826

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BS EN 62418:2010
Semiconductor devices. Metallization stress void test
SKU/ISBN:9780580626104

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BS EN 60191-6-20:2010
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages. Measuring methods for package dimensions of small outline J-lead packages (SOJ)
SKU/ISBN:9780580645662

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BS IEC 62615:2010
Electrostatic discharge sensitivity testing. Transmission line pulse (TLP). Component level
SKU/ISBN:9780580658747

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BS EN 60749-19:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods Die shear strength
SKU/ISBN:9780580687457

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BS EN 60749-7:2011
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
SKU/ISBN:9780580687525

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BS EN 60749-23:2004+A1:2011
Semiconductor devices. Mechanical and climatic test methods High temperature operating life
SKU/ISBN:9780580687532

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BS EN 60749-32:2003+A1:2010
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (externally induced)
SKU/ISBN:9780580687549

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BS EN 60749-29:2011
Semiconductor devices. Mechanical and climatic test methods Latch-up test
SKU/ISBN:9780580691386

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BS EN 60749-34:2010
Semiconductor devices. Mechanical and climatic test methods Power cycling
SKU/ISBN:9780580691645

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BS EN 60745-1:2009+A11:2010
Hand-held motor-operated electric tools. Safety General requirements
SKU/ISBN:9780580709869

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BS EN 60191-6-18:2010
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages. Design guide for ball grid array (BGA)
SKU/ISBN:9780580719479

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BS EN 60191-6-22:2013
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of surface mounted semiconductor device packages. Design guide for semiconductor packages Silicon Fine-pitch Ball Grid Array and Silicon Fi..
SKU/ISBN:9780580757204

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BS EN 60749-27:2006+A1:2012
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)
SKU/ISBN:9780580766084

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BS EN 60191-6-13:2016
Mechanical standardization of semiconductor devices Design guideline of open-top-type sockets for Fine-pitch Ball Grid Array (FBGA) and Fine-pitch Land Grid Array (FLGA)
SKU/ISBN:9780580831638

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BS IEC 60747-9:2019
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
SKU/ISBN:9780580947148

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BS IEC 60747-19-1:2019
Semiconductor devices Smart sensors. Control scheme of smart sensors
SKU/ISBN:9780539017045

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BS IEC 60747-18-3:2019
Semiconductor devices Semiconductor bio sensors. Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system
SKU/ISBN:9780580988431

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BS EN 60191-4:2014+A1:2018
Mechanical standardization of semiconductor devices Coding system and classification into forms of package outlines for semiconductor device packages
SKU/ISBN:9780580957475

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BS EN 62779-2:2016
Semiconductor devices. Semiconductor interface for human body communication Characterization of interfacing performances
SKU/ISBN:9780580787027

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BS EN 62779-1:2016
Semiconductor devices. Semiconductor interface for human body communication General requirements
SKU/ISBN:9780580779121

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BS EN IEC 60749-26:2018
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
SKU/ISBN:9780580976049

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BS EN IEC 60749-17:2019
Semiconductor devices. Mechanical and climatic test methods Neutron irradiation
SKU/ISBN:9780539000627

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BS IEC 62951-5:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for thermal characteristics of flexible materials
SKU/ISBN:9780580972911

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BS IEC 62047-29:2017
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
SKU/ISBN:9780580940132

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BS EN IEC 60191-1:2018
Mechanical standardization of semiconductor devices General rules for the preparation of outline drawings of discrete devices
SKU/ISBN:9780580844256

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BS EN 62779-3:2016
Semiconductor devices. Semiconductor interface for human body communication Functional type and its operational conditions
SKU/ISBN:9780580865923

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BS EN 60749-9:2017
Semiconductor devices. Mechanical and climatic test methods Permanence of marking
SKU/ISBN:9780580949357

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BS EN IEC 60749-13:2018
Semiconductor devices. Mechanical and climatic test methods Salt atmosphere
SKU/ISBN:9780580984228

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BS IEC 60747-18-2:2020
Semiconductor devices Semiconductor bio sensors. Evaluation process of lens-free CMOS photonic array sensor package modules
SKU/ISBN:9780580973925

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BS EN 60749-3:2017
Semiconductor devices. Mechanical and climatic test methods External visual examination
SKU/ISBN:9780580948930

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BS EN 60749-4:2017
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
SKU/ISBN:9780580942297

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BS EN IEC 60749-12:2018
Semiconductor devices. Mechanical and climatic test methods Vibration, variable frequency
SKU/ISBN:9780580986826

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BS EN 60749-6:2017
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
SKU/ISBN:9780580948923

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PD IEC/TR 63133:2017
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
SKU/ISBN:9780580988516

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BS IEC 60747-14-10:2019
Semiconductor devices Semiconductor sensors. Performance evaluation methods for wearable glucose sensors
SKU/ISBN:9780580966514

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BS IEC 62779-4:2020
Semiconductor devices. Semiconductor interface for human body communication Capsule endoscope
SKU/ISBN:9780580991974

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BS IEC 62880-1:2017
Semiconductor devices. Stress migration test standard Copper stress migration test standard
SKU/ISBN:9780580858086

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BS EN IEC 60749-15:2020
Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices
SKU/ISBN:9780539049374

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BS EN IEC 60749-30:2020
Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing
SKU/ISBN:9780539045833

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BS EN IEC 60749-20:2020
Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
SKU/ISBN:9780539045840

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BS IEC 62830-5:2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test method for measuring generated power from flexible thermoelectric devices
SKU/ISBN:9780580972898

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BS IEC 60747-14-11:2021
Semiconductor devices Semiconductor sensors. Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
SKU/ISBN:9780580989827

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BS EN IEC 60068-2-13:2021
Environmental testing Tests. Test M: Low air pressure
SKU/ISBN:9780539037104

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BS EN IEC 63287-1:2021
Semiconductor devices. Generic semiconductor qualification guidelines Guidelines for IC reliability qualification
SKU/ISBN:9780539127232

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PD IEC TR 63378-1:2021
Thermal standardization on semiconductor packages Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages
SKU/ISBN:9780539171525

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BS EN IEC 60749-39:2022
Semiconductor devices. Mechanical and climatic test methods Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
SKU/ISBN:9780539152005

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BS EN IEC 60749-28:2022
Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level
SKU/ISBN:9780539136579

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BS EN IEC 60749-37:2022
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer
SKU/ISBN:9780539151992

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BS EN IEC 62007-1:2015+A1:2022
Semiconductor optoelectronic devices for fibre optic system applications Specification template for essential ratings and characteristics
SKU/ISBN:9780539205282

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BS EN 61975:2010+A2:2022
High-voltage direct current (HVDC) installations. System tests
SKU/ISBN:9780539166644

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BS IEC 62951-9:2022
Semiconductor devices. Flexible and stretchable semiconductor devices Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
SKU/ISBN:9780539144376

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BS EN IEC 63364-1:2022
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
SKU/ISBN:9780539166606

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BS EN IEC 63287-2:2023
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
SKU/ISBN:9780539156645

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BS IEC 63229:2021
Semiconductor devices. Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
SKU/ISBN:9780539029208

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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
SKU/ISBN:9780539025330

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BS EN 60749-44:2016
Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices
SKU/ISBN:9780580862038

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BS EN 60749-40:2011
Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge
SKU/ISBN:9780580646294

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BS EN 60749-42:2014
Semiconductor devices. Mechanical and climatic test methods Temperature and humidity storage
SKU/ISBN:9780580790911

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BS EN 60749-35:2006
Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components
SKU/ISBN:0580497399

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BS EN 60749-25:2003
Semiconductor devices. Mechanical and climatic test methods Temperature cycling
SKU/ISBN:0580428591

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BS EN 60749-2:2002
Semiconductor devices. Mechanical and climatic test methods Low air pressure
SKU/ISBN:0580403971

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BS EN 60749-38:2008
Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory
SKU/ISBN:9780580548758

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BS EN 60749-8:2003
Semiconductor devices. Mechanical and climatic test methods Sealing
SKU/ISBN:0580422011

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BS EN 60749-1:2003
Semiconductor devices. Mechanical and climatic test methods General
SKU/ISBN:0580421988

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BS EN 60749-11:2002
Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method
SKU/ISBN:0580403955

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BS EN 60749-33:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave
SKU/ISBN:0580439739

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BS EN 60749-24:2004
Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST
SKU/ISBN:0580439720

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BS EN 60749-14:2003
Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)
SKU/ISBN:0580430820

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BS EN 60749-20-1:2009
Semiconductor devices. Mechanical and climatic test methods Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat
SKU/ISBN:9780580546013

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BS EN 60749-36:2003
Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
SKU/ISBN:0580420655

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BS EN IEC 60749-41:2020
Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices
SKU/ISBN:9780580962875

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BS EN 60749-16:2003
Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)
SKU/ISBN:0580420620

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BS IEC 63378-2-1:2024
Thermal standardization on semiconductor packages 3D thermal simulation models of semiconductor packages for steady-state analysis. Discrete packages
SKU/ISBN:9780539258998

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BS IEC 60747-5-4:2022+A1:2024
Semiconductor devices Optoelectronic devices. Semiconductor lasers
SKU/ISBN:9780539268775

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Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

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