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BS EN IEC 60749-20:2020 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

BS EN IEC 60749-20:2020

Semiconductor devices. Mechanical and climatic test methods Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat


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ISBN: 9780539045840

Keywords:
Plastics, Climate, Thermal testing, Encapsulated, Surface mounting devices, Damp-heat tests, Environmental testing, Electronic equipment and components, Semiconductor devices, Integrated circuits, Soldering, Solderability testing, Mechanical testing, PDF
Publication Date14 Oct 2020
Product SKU30394486
ISBN9780539045840
BSI CodeBS EN IEC 60749-20:2020
No. of pages32
ReplacesBS EN 60749-20:2009
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-20 Ed.3.0
  • IEC 60749-20 Ed.3.0




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