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BS EN 60749-25:2003 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Temperature cycling

Semiconductor devices. Mechanical and climatic test methods Temperature cycling

BS EN 60749-25:2003

Semiconductor devices. Mechanical and climatic test methods Temperature cycling


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ISBN: 0580428591

Keywords:
Thermal testing, Solders, Electronic equipment and components, Integrated circuits, Environmental testing, Climate, Testing conditions, Thermal-cycling tests, Semiconductor devices, Heating tests, Mechanical testing, PDF
Publication Date30 Oct 2003
Product SKU30069164
ISBN0580428591
BSI CodeBS EN 60749-25:2003
No. of pages16
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 60749-25:2003
  • EN 60749-25:2003
  • EN 60068-2-30:1999




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