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BS EN 60749-14:2003 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)

Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)

BS EN 60749-14:2003

Semiconductor devices. Mechanical and climatic test methods Robustness of terminations (lead integrity)


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ISBN: 0580430820

Keywords:
Testing conditions, Semiconductor devices, Torque, Qualification approval, Electronic equipment and components, Mechanical testing, Fatigue testing, Destructive testing, Tensile testing, Interfaces, Defects, Bend testing, Environmental testing, Climate, Semiconductors, Integrated circuits, PDF
Publication Date15 Dec 2003
Product SKU30069159
ISBN0580430820
BSI CodeBS EN 60749-14:2003
No. of pages18
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 60749-14:2003
  • EN 60749-14 (IEC 60749-14:2003) AS
  • EN 60068-2-13:1999




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