BS EN 60749-40:2011 | British Standards

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31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge

BS EN 60749-40:2011

Semiconductor devices. Mechanical and climatic test methods Board level drop test method using a strain gauge

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ISBN: 9780580646294

Keywords:
Integrated circuits, Drop tests, Mechanical testing, Semiconductor devices, Electronic equipment and components, Impact testing, Strain measurement, Surface mounting devices, Accelerated testing, Environmental testing, Printed-circuit boards, PDF

Publication Date	30 Sep 2011
Product SKU	30190357
ISBN	9780580646294
BSI Code	BS EN 60749-40:2011
No. of pages	26
Publisher	British Standards Institution

Identical National Standard to:

EN 60384-3:2006
IEC 60749-40:2011
EN 60749-40:2011

BS EN 60749-40:2011 | British Standards

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