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BS EN 60749-6:2017 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Storage at high temperature

Semiconductor devices. Mechanical and climatic test methods Storage at high temperature

BS EN 60749-6:2017

Semiconductor devices. Mechanical and climatic test methods Storage at high temperature


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ISBN: 9780580948923

Keywords:
High temperatures, Electronic storage, Semiconductor devices, Semiconductor storage, Climate, Integrated circuits, Environmental testing, Electronic equipment and components, Mechanical testing, PDF
Publication Date24 Nov 2017
Product SKU30344797
ISBN9780580948923
BSI CodeBS EN 60749-6:2017
No. of pages12
ReplacesBS EN 60749-6:2002
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-6:2017
  • IEC 60749-6:2017




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