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BS EN 60749-38:2008 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory

Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory

BS EN 60749-38:2008

Semiconductor devices. Mechanical and climatic test methods Soft error test method for semiconductor devices with memory


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ISBN: 9780580548758

Keywords:
Errors, Environmental testing, Electronic equipment and components, Computer storage devices, Semiconductor devices, Mechanical testing, Integrated circuits, Alpha particles, PDF
Publication Date30 Jun 2008
Product SKU30126445
ISBN9780580548758
BSI CodeBS EN 60749-38:2008
No. of pages16
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 60749-38:2008
  • EN 60749-38:2008




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