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BS EN 60749-4:2017 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)

Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)

BS EN 60749-4:2017

Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)


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ISBN: 9780580942297

Keywords:
Environmental testing, Semiconductor devices, Integrated circuits, Electronic equipment and components, Climate, Accelerated testing, Mechanical testing, Damp-heat tests, PDF
Publication Date28 Nov 2017
Product SKU30341342
ISBN9780580942297
BSI CodeBS EN 60749-4:2017
No. of pages16
ReplacesBS EN 60749-4:2002
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-4:2017
  • IEC 60749-4:2017




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