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BS EN IEC 60749-41:2020 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices

Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices

BS EN IEC 60749-41:2020

Semiconductor devices. Mechanical and climatic test methods Standard reliability testing methods of non-volatile memory devices


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ISBN: 9780580962875

Keywords:
Flammability, Moisture measurement, Defects, Solderability testing, Storage, Testing conditions, Visual inspection (testing), Marking, Stress, Fire tests, Test equipment, Vibration testing, Temperature measurement, Specimen preparation, Semiconductor devices, Accelerated testing, Bonding, Electric terminals, Electrical testing, Endurance testing, Test specimens, Thermal-shock tests, Environmental , PDF
Publication Date09 Sep 2020
Product SKU30350993
ISBN9780580962875
BSI CodeBS EN IEC 60749-41:2020
No. of pages26
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-41
  • IEC 60749-41




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