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BS EN 60749-19:2003+A1:2010 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Die shear strength

Semiconductor devices. Mechanical and climatic test methods Die shear strength

BS EN 60749-19:2003+A1:2010

Semiconductor devices. Mechanical and climatic test methods Die shear strength


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ISBN: 9780580687457

Keywords:
Integrated circuits, Substrates (insulating), Quality control, Environmental testing, Strength of materials, Semiconductor devices, Shear testing, Shear strength, Electrical components, Climate, Mechanical testing, Electrical equipment, Electronic equipment and components, PDF
Publication Date31 Oct 2010
Product SKU30208059
ISBN9780580687457
BSI CodeBS EN 60749-19:2003+A1:2010
No. of pages10
Replaces
Amends09/30208058 DC|BS EN 60749-19:2003
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-19:2003/A1:2010
  • IEC 60749-19:2003/AMD1:2010




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