BS EN 60749-44:2016 | British Standards

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31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

BS EN 60749-44:2016

Semiconductor devices. Mechanical and climatic test methods Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

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ISBN: 9780580862038

Keywords:
Water vapour, Water-vapour tests, Climate, Gas analysis, Integrated circuits, Semiconductor devices, Moisture measurement, Environmental testing, Mechanical testing, Electronic equipment and components, PDF

Publication Date	30 Nov 2016
Product SKU	30299003
ISBN	9780580862038
BSI Code	BS EN 60749-44:2016
No. of pages	26
Publisher	British Standards Institution

Identical National Standard to:

IEC 60749-44:2016
EN 60749-44:2016

BS EN 60749-44:2016 | British Standards

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