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BS EN 60749-34:2010 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Power cycling

Semiconductor devices. Mechanical and climatic test methods Power cycling

BS EN 60749-34:2010

Semiconductor devices. Mechanical and climatic test methods Power cycling


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ISBN: 9780580691645

Keywords:
Destructive testing, Environmental testing, Integrated circuits, Stress, Low voltage, Climate, Electronic equipment and components, Mechanical testing, Thermal stress, Power losses, Electrical testing, Stress analysis, Semiconductor devices, PDF
Publication Date28 Feb 2011
Product SKU30209940
ISBN9780580691645
BSI CodeBS EN 60749-34:2010
No. of pages14
ReplacesBS EN 60749-34:2004
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-34:2010
  • IEC 60749-34:2010




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