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BS EN 60749-27:2006+A1:2012 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)

Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)

BS EN 60749-27:2006+A1:2012

Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Machine model (MM)


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ISBN: 9780580766084

Keywords:
Electrical testing, Grades (quality), Sensitivity, Damage, Semiconductor devices, Classification systems, Electronic equipment and components, Test models, Mechanical testing, Electrostatics, Integrated circuits, Degradation, Climate, Environmental testing, PDF
Publication Date31 Jan 2013
Product SKU30252691
ISBN9780580766084
BSI CodeBS EN 60749-27:2006+A1:2012
No. of pages16
Replaces
AmendsBS EN 60749-27:2006|11/30252690 DC
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 60749-27:2006/AMD1:2012
  • EN 60749-27:2006/A1:2012




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