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BS EN IEC 63378-6:2026 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Thermal standardization on semiconductor packages Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points

Thermal standardization on semiconductor packages Thermal resistance and capacitance model for transient temperature prediction at junction and measurement points




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ISBN: 9780539316773

Keywords:
Semiconductor materials, Semiconductor technology, Resistance (thermal), Shock resistance (thermal), Capacitance measurement, PDF
Publication Date24 Mar 2026
Product SKU30492189
ISBN9780539316773
BSI CodeBS EN IEC 63378-6:2026
No. of pages34
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 63378-6:2026
  • EN IEC 63378-6:2026




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