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BS EN IEC 60749-26:2018 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)

BS EN IEC 60749-26:2018

Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)


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ISBN: 9780580976049

Keywords:
Classification systems, Electrical testing, Damage, Mechanical testing, Grades (quality), Test models, Human body, Environmental testing, Electrostatics, Integrated circuits, Climate, Sensitivity, Degradation, Electronic equipment and components, Semiconductor devices, PDF
Publication Date30 Apr 2018
Product SKU30356570
ISBN9780580976049
BSI CodeBS EN IEC 60749-26:2018
No. of pages54
ReplacesBS EN 60749-26:2014
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 60749-26:2018
  • EN IEC 60749-26:2018




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