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BS EN IEC 60749-5:2024 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test

Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test

BS EN IEC 60749-5:2024

Semiconductor devices. Mechanical and climatic test methods Steady-state temperature humidity bias life test


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ISBN: 9780539232165

Keywords:
Humidity, Temperature, Mechanical testing, Test methods, Semiconductor devices, PDF
Publication Date06 Feb 2024
Product SKU30459249
ISBN9780539232165
BSI CodeBS EN IEC 60749-5:2024
No. of pages14
ReplacesBS EN 60749-5:2017
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-5 Ed.3.0
  • IEC 60749-5 Ed.3.0




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