BS EN 60749-20-1:2009 | British Standards

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31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat

BS EN 60749-20-1:2009

Semiconductor devices. Mechanical and climatic test methods Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat

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ISBN: 9780580546013

Keywords:
Mechanical testing, Transportation, Semiconductor devices, Electronic equipment and components, Damp-heat tests, Integrated circuits, Climate, Environmental testing, Labelling (process), Soldering, Environment (working), Thermal testing, Surface mounting devices, Materials handling, Packaging, PDF

Publication Date	31 Jul 2009
Product SKU	30119209
ISBN	9780580546013
BSI Code	BS EN 60749-20-1:2009
No. of pages	38
Publisher	British Standards Institution

Identical National Standard to:

EN 60749-20-1:2009
IEC 60749-20-1:2009

BS EN 60749-20-1:2009 | British Standards

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