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BS EN 60749-2:2002 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Low air pressure

Semiconductor devices. Mechanical and climatic test methods Low air pressure

BS EN 60749-2:2002

Semiconductor devices. Mechanical and climatic test methods Low air pressure


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ISBN: 0580403971

Keywords:
Integrated circuits, Pressure, Electronic equipment and components, Semiconductor devices, Climate, Air, Low-pressure tests, Mechanical testing, Environmental testing, PDF
Publication Date24 Sep 2002
Product SKU30064925
ISBN0580403971
BSI CodeBS EN 60749-2:2002
No. of pages10
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-2:2002
  • IEC 60749-2:2002




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