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BS EN IEC 60749-17:2019 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Neutron irradiation

Semiconductor devices. Mechanical and climatic test methods Neutron irradiation

BS EN IEC 60749-17:2019

Semiconductor devices. Mechanical and climatic test methods Neutron irradiation


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ISBN: 9780539000627

Keywords:
Irradiation, Electronic equipment and components, Destructive testing, Climate, Neutrons, Military equipment, Integrated circuits, Military engineering, Dosimeters, Radiation measurement, Environmental testing, Mechanical testing, Nuclear particles, Space technology components, Degradation, Semiconductor devices, PDF
Publication Date15 May 2019
Product SKU30373810
ISBN9780539000627
BSI CodeBS EN IEC 60749-17:2019
No. of pages14
ReplacesBS EN 60749-17:2003
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 60749-17 Ed.2.0
  • EN 60749-17 Ed.2.0




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