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BS EN IEC 60749-10:2022 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly

Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly

BS EN IEC 60749-10:2022

Semiconductor devices. Mechanical and climatic test methods Mechanical shock. device and subassembly


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ISBN: 9780539173451

Keywords:
Integrated circuits, Destructive testing, Electronic equipment and components, Mechanical shock, Environmental testing, Climate, Mechanical testing, Impact testing, Semiconductor devices, PDF
Publication Date16 Aug 2022
Product SKU30435580
ISBN9780539173451
BSI CodeBS EN IEC 60749-10:2022
No. of pages16
ReplacesBS EN 60749-10:2002
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-10 Ed.2.0
  • IEC 60749-10 Ed.2.0




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