BS IEC 62047-29:2017 | British Standards

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31.080.01 Semiconductor devices in general

Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature

BS IEC 62047-29:2017

Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature


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