BS IEC 62047-29:2017 | British Standards

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31.080.01 Semiconductor devices in general

Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature

BS IEC 62047-29:2017

Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature

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ISBN: 9780580940132

Keywords:
Analysis, Test methods, Electromechanical devices, Semiconductor devices, Thin films, PDF

Publication Date	15 Mar 2018
Product SKU	30340355
ISBN	9780580940132
BSI Code	BS IEC 62047-29:2017
No. of pages	16
Publisher	British Standards Institution

Identical National Standard to:

IEC 62047-29:2017

BS IEC 62047-29:2017 | British Standards

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