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BS IEC 62047-29:2017 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature

Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature

BS IEC 62047-29:2017

Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature


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ISBN: 9780580940132

Keywords:
Analysis, Test methods, Electromechanical devices, Semiconductor devices, Thin films, PDF
Publication Date15 Mar 2018
Product SKU30340355
ISBN9780580940132
BSI CodeBS IEC 62047-29:2017
No. of pages16
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-29:2017




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