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BS EN 62418:2010 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Metallization stress void test

Semiconductor devices. Metallization stress void test

BS EN 62418:2010

Semiconductor devices. Metallization stress void test


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ISBN: 9780580626104

Keywords:
Aluminium, Diffusion, Stress, Electrical measurement, Copper, Metals, Surfaces, Semiconductor devices, Electronic equipment and components, Visual inspection (testing), Semiconductors, PDF
Publication Date31 Aug 2010
Product SKU30180165
ISBN9780580626104
BSI CodeBS EN 62418:2010
No. of pages20
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62418:2010
  • EN 62418:2010
  • IEC SRD 62913-2-4:2019




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