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BS EN 60749-9:2017 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Permanence of marking

Semiconductor devices. Mechanical and climatic test methods Permanence of marking

BS EN 60749-9:2017

Semiconductor devices. Mechanical and climatic test methods Permanence of marking


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ISBN: 9780580949357

Keywords:
Environmental testing, Climate, Permanent, Mechanical testing, Integrated circuits, Semiconductor devices, Solvent-resistance tests, Marking, Non-destructive testing, Chemical-resistance tests, Electronic equipment and components, PDF
Publication Date27 Nov 2017
Product SKU30345064
ISBN9780580949357
BSI CodeBS EN 60749-9:2017
No. of pages14
ReplacesBS EN 60749-9:2002
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 60749-9:2017
  • EN 60749-9:2017




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