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BS EN IEC 60749-28:2022 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level

Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level

BS EN IEC 60749-28:2022

Semiconductor devices. Mechanical and climatic test methods Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). device level


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ISBN: 9780539136579

Keywords:
Electrostatics, Electric charge, Electronic equipment and components, Electric discharges, Mechanical testing, Semiconductor devices, Test methods, Environmental testing, Integrated circuits, PDF
Publication Date06 Sep 2022
Product SKU30419236
ISBN9780539136579
BSI CodeBS EN IEC 60749-28:2022
No. of pages54
ReplacesBS EN 60749-28:2017
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-28 Ed.2.0
  • IEC 60749-28 Ed.2.0




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