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BS EN IEC 60749-30:2020 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing

Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing

BS EN IEC 60749-30:2020

Semiconductor devices. Mechanical and climatic test methods Preconditioning of non-hermetic surface mount devices prior to reliability testing


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ISBN: 9780539045833

Keywords:
Semiconductor devices, Electronic equipment and components, Mechanical testing, Performance testing, Specimen preparation, Environmental testing, Reliability, Climate, Surface mounting devices, Integrated circuits, PDF
Publication Date30 Sep 2020
Product SKU30394482
ISBN9780539045833
BSI CodeBS EN IEC 60749-30:2020
No. of pages18
ReplacesBS EN 60749-30:2005+A1:2011
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-30 Ed.2.0
  • IEC 60749-30 Ed.2.0




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