BS EN 60749-24:2004 | British Standards

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31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST

BS EN 60749-24:2004

Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST

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ISBN: 0580439720

Keywords:
Solid-state physics, Accelerated testing, Mechanical testing, Semiconductor devices, Accelerated corrosion tests, Moisture measurement, Climate, Temperature, Humidity, Performance testing, Corrosion resistance, Destructive testing, Electronic equipment and components, Damp-heat tests, Reliability, Environmental testing, Integrated circuits, Testing conditions, PDF

Publication Date	24 Jun 2004
Product SKU	30079670
ISBN	0580439720
BSI Code	BS EN 60749-24:2004
No. of pages	10
Publisher	British Standards Institution

Identical National Standard to:

IEC 60749-24:2004
EN 60749-24:2004

BS EN 60749-24:2004 | British Standards

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