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BS IEC 62880-1:2017 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Stress migration test standard Copper stress migration test standard

Semiconductor devices. Stress migration test standard Copper stress migration test standard

BS IEC 62880-1:2017

Semiconductor devices. Stress migration test standard Copper stress migration test standard


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ISBN: 9780580858086

Keywords:
Electromechanical devices, Electronic equipment and components, Integrated circuits, Vocabulary, Terminology, Semiconductor devices, Semiconductor technology, PDF
Publication Date21 Jul 2020
Product SKU30297228
ISBN9780580858086
BSI CodeBS IEC 62880-1:2017
No. of pages28
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62880-1:2017




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