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BS EN 60749-35:2006 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components

Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components

BS EN 60749-35:2006

Semiconductor devices. Mechanical and climatic test methods Acoustic microscopy for plastic encapsulated electronic components


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ISBN: 0580497399

Keywords:
Integrated circuits, Mechanical testing, Non-destructive testing, Microscopic analysis, Semiconductor devices, Plastics, Encapsulated, Electronic equipment and components, Test equipment, Environmental testing, Packages, Ultrasonic testing, Climate, PDF
Publication Date30 Nov 2006
Product SKU30131682
ISBN0580497399
BSI CodeBS EN 60749-35:2006
No. of pages24
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 60749-35:2006
  • EN 60749-35:2006
  • IEC 60749-35:2006
  • EN 61140:2002




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