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BS EN IEC 60749-7:2026 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases

Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases

BS EN IEC 60749-7:2026

Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases


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ISBN: 9780539327373

Keywords:
Water vapour, Mechanical testing, Climate, Moisture measurement, Integrated circuits, Semiconductor devices, Environmental testing, Water-vapour tests, Electronic equipment and components, Gas analysis, PDF
Publication Date21 Jan 2026
Product SKU30497539
ISBN9780539327373
BSI CodeBS EN IEC 60749-7:2026
No. of pages18
ReplacesBS EN 60749-7:2011
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 60749-7:2025
  • EN IEC 60749-7:2026




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