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BS IEC 62047-37:2020 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application

Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application

BS IEC 62047-37:2020

Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application


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ISBN: 9780539025330

Keywords:
Durability, Sensors, Thin films, Test methods, Semiconductor devices, Electromechanical storage, Environmental testing, Piezoelectric devices, PDF
Publication Date05 Apr 2023
Product SKU30383936
ISBN9780539025330
BSI CodeBS IEC 62047-37:2020
No. of pages20
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-37 Ed.1.0




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