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BS EN 60749-1:2003 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods General

Semiconductor devices. Mechanical and climatic test methods General

BS EN 60749-1:2003

Semiconductor devices. Mechanical and climatic test methods General


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ISBN: 0580421988

Keywords:
Environmental testing, Testing conditions, Semiconductor devices, Integrated circuits, Mechanical testing, Electronic equipment and components, Climate, PDF
Publication Date07 Jul 2003
Product SKU30047762
ISBN0580421988
BSI CodeBS EN 60749-1:2003
No. of pages12
ReplacesBS EN 60749:1999
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-1 (IEC 60749-1:2002) AS
  • IEC 60749-1:2002




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