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BS EN IEC 60749-37:2022 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer

Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer

BS EN IEC 60749-37:2022

Semiconductor devices. Mechanical and climatic test methods Board level drop test method using an accelerometer


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ISBN: 9780539151992

Keywords:
Semiconductor devices, Semiconductors, Electronic components, Printed-circuit boards, Electrical failure, Failure analysis, Testing, Reports, Accelerometers, PDF
Publication Date22 Nov 2022
Product SKU30425837
ISBN9780539151992
BSI CodeBS EN IEC 60749-37:2022
No. of pages28
ReplacesBS EN 60749-37:2008
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-37 Ed.2.0
  • IEC 60749-37 Ed.2.0




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