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BS EN 60749-11:2002 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method

Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method

BS EN 60749-11:2002

Semiconductor devices. Mechanical and climatic test methods Rapid change of temperature. Two-fluid-bath method


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ISBN: 0580403955

Keywords:
Environmental testing, Integrated circuits, Mechanical testing, Temperature measurement, Electronic equipment and components, Destructive testing, Temperature, Semiconductor devices, Climate, Thermal testing, PDF
Publication Date24 Oct 2003
Product SKU30103407
ISBN0580403955
BSI CodeBS EN 60749-11:2002
No. of pages12
CorrectsBS EN 60749-11:2002
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 60749-11:2002
  • EN 60749-11 (IEC 60749-11:2002) AS




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