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BS EN 60749-8:2003 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Sealing

Semiconductor devices. Mechanical and climatic test methods Sealing

BS EN 60749-8:2003

Semiconductor devices. Mechanical and climatic test methods Sealing


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ISBN: 0580422011

Keywords:
Climate, Leak tests, Integrated circuits, Semiconductor devices, Environmental testing, Electronic equipment and components, Mechanical testing, Seals, PDF
Publication Date03 Jul 2003
Product SKU30077132
ISBN0580422011
BSI CodeBS EN 60749-8:2003
No. of pages20
ReplacesBS EN 60749:1999
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-8:2003
  • IEC 60749-8:2002
  • IEC 60749-8:2002/COR1:2003




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