Buy British Standards OnlineBuy Standards Online Worldwide Delivery AvailableBuy Downloads of British StandardsSecure Online Ordering
Start of Content

BS EN IEC 60749-23:2026 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods High temperature operating life

Semiconductor devices. Mechanical and climatic test methods High temperature operating life

BS EN IEC 60749-23:2026

Semiconductor devices. Mechanical and climatic test methods High temperature operating life


Buy from us with a 10% discount on standard BSI prices. PDF and printed formats are available.
You can choose which format you require once the item has been added to the shopping cart.

Our Price: £127.80
Normal BSI Price: £142.00



ISBN: 9780539357264

Keywords:
Integrated circuits, Thermal testing, High-temperature testing, Reliability, Performance testing, Life (durability), Climate, Mechanical testing, Qualification approval, Endurance testing, Semiconductor devices, Environmental testing, Electronic equipment and components, Accelerated testing, Operating conditions, PDF
Publication Date03 Feb 2026
Product SKU30511056
ISBN9780539357264
BSI CodeBS EN IEC 60749-23:2026
No. of pages14
ReplacesBS EN 60749-23:2004+A1:2011
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-23 Ed.2.0
  • IEC 60749-23:2025




spacer
End of Content
Standards A-Z Subject Index
© 2016 - 2026 BuyStandardsOnline.co.uk | Sitemap | Ways To Order | Delivery Charges | Contact Us | Terms and Conditions | Official BSI Distributor | Worldwide Delivery