BS EN 60749-33:2004 | British Standards

Standards Shop | ICS 31 | ICS 31.080 | ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave

BS EN 60749-33:2004

Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased autoclave

Buy a printed copy from us with a 10% discount, or follow the link to purchase a PDF on the BSI website.

BSI Price (PDF/Printed): £134.00
Our Price (Printed only): £120.60

ISBN: 0580439739

Keywords:
Electronic equipment and components, Solid-state physics, Semiconductor devices, Mechanical testing, Temperature, Environmental testing, Humidity, Destructive testing, Accelerated corrosion tests, Accelerated testing, Integrated circuits, Corrosion resistance, Testing conditions, Pressure, Moisture measurement, Climate, Damp-heat tests, PDF

Publication Date	22 Jun 2004
Product SKU	30075539
ISBN	0580439739
BSI Code	BS EN 60749-33:2004
No. of pages	10
Publisher	British Standards Institution

Identical National Standard to:

EN 60749-33 (IEC 60749-33:2004) AS
IEC 60749-33:2004

BS EN 60749-33:2004 | British Standards

Popular Topics