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BS EN 60749-36:2003 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state

Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state

BS EN 60749-36:2003

Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state


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ISBN: 0580420655

Keywords:
Endurance testing, Integrated circuits, Impact testing, Semiconductor devices, Mechanical testing, Electronic equipment and components, Acceleration measurement, Acceleration tests, Climate, Environmental testing, Stress, Destructive testing, PDF
Publication Date19 Jun 2003
Product SKU30061180
ISBN0580420655
BSI CodeBS EN 60749-36:2003
No. of pages8
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 60749-36:2003
  • EN 60749-36:2003




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