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BS EN 60749-16:2003 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)

Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)

BS EN 60749-16:2003

Semiconductor devices. Mechanical and climatic test methods Particle impact noise detection (PIND)


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ISBN: 0580420620

Keywords:
Climate, Electronic equipment and components, Environmental testing, Acoustic measurement, Mechanical testing, Holes, Solders, Semiconductor devices, Wires, Non-destructive testing, Noise (spurious signals), Vibration testing, Particulate materials, Integrated circuits, Ceramics, PDF
Publication Date24 Jun 2004
Product SKU30115574
ISBN0580420620
BSI CodeBS EN 60749-16:2003
No. of pages10
CorrectsBS EN 60749-16:2003
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-16:2003
  • IEC 60749-16:2003




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