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BS EN IEC 60749-24:2026 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST

Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST

BS EN IEC 60749-24:2026

Semiconductor devices. Mechanical and climatic test methods Accelerated moisture resistance. Unbiased HAST


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ISBN: 9780539327403

Keywords:
Solid-state physics, Accelerated testing, Mechanical testing, Semiconductor devices, Accelerated corrosion tests, Moisture measurement, Climate, Temperature, Humidity, Performance testing, Corrosion resistance, Destructive testing, Electronic equipment and components, Damp-heat tests, Reliability, Environmental testing, Integrated circuits, Testing conditions, PDF
Publication Date21 Jan 2026
Product SKU30497548
ISBN9780539327403
BSI CodeBS EN IEC 60749-24:2026
No. of pages16
ReplacesBS EN 60749-24:2004
PublisherBritish Standards Institution
Identical National Standard to:
  • EN IEC 60749-24 ED.2
  • IEC 60749-24:2025




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