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BS EN 60749-23:2004+A1:2011 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods High temperature operating life

Semiconductor devices. Mechanical and climatic test methods High temperature operating life

BS EN 60749-23:2004+A1:2011

Semiconductor devices. Mechanical and climatic test methods High temperature operating life


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ISBN: 9780580687532

Keywords:
Integrated circuits, Thermal testing, High-temperature testing, Reliability, Performance testing, Life (durability), Climate, Mechanical testing, Qualification approval, Endurance testing, Semiconductor devices, Environmental testing, Electronic equipment and components, Accelerated testing, Operating conditions, PDF
Publication Date30 Jun 2011
Product SKU30208090
ISBN9780580687532
BSI CodeBS EN 60749-23:2004+A1:2011
No. of pages12
AmendsBS EN 60749-23:2004|09/30208089 DC
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 61051-1:2018
  • IEC 60749-23:2004/AMD1:2011
  • EN 60749-23:2004/A1:2011




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