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BS EN IEC 60749-15:2020 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.01

31.080.01 Semiconductor devices in general

Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices

Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices

BS EN IEC 60749-15:2020

Semiconductor devices. Mechanical and climatic test methods Resistance to soldering temperature for through-hole mounted devices


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ISBN: 9780539049374

Keywords:
Soldering, Environmental testing, Solderability testing, Slots, Destructive testing, Semiconductor devices, Encapsulated, Holes, Integrated circuits, Climate, Thermal testing, Electronic equipment and components, Mechanical testing, PDF
Publication Date01 Oct 2020
Product SKU30395804
ISBN9780539049374
BSI CodeBS EN IEC 60749-15:2020
No. of pages16
ReplacesBS EN 60749-15:2010|BS EN 60749-15:2010
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60749-15 Ed.3.0
  • IEC 60749-15 Ed.3.0




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