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British Standards for 31.080.99 Other semiconductor devices | Module: ICS 31.080.99

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

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BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
SKU/ISBN:058016263X

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BS IEC 60747-14-2:2000
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors Hall elements
SKU/ISBN:0580373134

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BS EN 60512-2-6:2002
Connectors for electronic equipment. Tests and measurements. Electrical continuity and contact resistance tests Test 2f. Housing (shell) electrical continuity
SKU/ISBN:0580396703

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BS EN 60146-2:2000
Semiconductor convertors. General requirements and line commutated convertors Self-commutated semiconductor converters including direct d.c. converters
SKU/ISBN:0580362639

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BS EN 60747-5-2:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
SKU/ISBN:0580291448

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BS EN 60747-5-3:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Measuring methods
SKU/ISBN:0580291456

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BS EN 62047-2:2006
Semiconductor devices. Micro-electromechanical devices Tensile testing method of thin film materials
SKU/ISBN:0580497402

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BS EN 61967-2:2005
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method
SKU/ISBN:0580474763

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BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
SKU/ISBN:9780580540486

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BS EN 62047-3:2006
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
SKU/ISBN:0580497410

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BS EN 62258-5:2006
Semiconductor die products Requirements for information concerning electrical simulation
SKU/ISBN:0580496082

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BS EN 62258-6:2006
Semiconductor die products Requirements for information concerning thermal simulation
SKU/ISBN:0580496090

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BS EN 62047-4:2010
Semiconductor devices. Micro-electromechanical devices Generic specification for MEMS
SKU/ISBN:9780580568572

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PD IEC/TR 62258-7:2007
Semiconductor die products XML schema for data exchange
SKU/ISBN:9780580582677

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BS EN 60464-2:2001
Varnishes used for electrical insulation Methods of test
SKU/ISBN:0580387542

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BS EN 62047-6:2010
Semiconductor devices. Micro-electromechanical devices Axial fatigue testing methods of thin film materials
SKU/ISBN:9780580585449

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BS EN 62258-1:2010
Semiconductor die products Procurement and use
SKU/ISBN:9780580591105

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PD IEC/TR 62258-8:2008
Semiconductor die products EXPRESS model schema for data exchange
SKU/ISBN:9780580604522

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BS EN 62047-7:2011
Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection
SKU/ISBN:9780580606281

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BS EN 62047-8:2011
Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films
SKU/ISBN:9780580606298

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BS EN 62258-2:2011
Semiconductor die products Exchange data formats
SKU/ISBN:9780580618925

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BS IEC 60747-14-3:2009
Semiconductor devices Semiconductor sensors. Pressure sensors
SKU/ISBN:9780580629013

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BS EN 62047-10:2011
Semiconductor devices. Micro-electromechanical devices Micro-pillar compression test for MEMS materials
SKU/ISBN:9780580694479

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BS EN 62047-11:2013
Semiconductor devices. Micro-electromechanical devices Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems
SKU/ISBN:9780580694486

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BS EN 62047-13:2012
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
SKU/ISBN:9780580694509

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BS EN 62047-15:2015
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass
SKU/ISBN:9780580708022

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BS EN 62047-18:2013
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials
SKU/ISBN:9780580720116

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BS EN 62047-17:2015
Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films
SKU/ISBN:9780580722035

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BS EN 62047-14:2012
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
SKU/ISBN:9780580722974

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PD CLC/TR 62258-4:2013
Semiconductor die products Questionnaire for die users and suppliers
SKU/ISBN:9780580729010

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BS EN 62047-12:2011
Semiconductor devices. Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
SKU/ISBN:9780580763014

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BS EN 62047-19:2013
Semiconductor devices. Micro-electromechanical devices Electronic compasses
SKU/ISBN:9780580759376

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BS EN 62047-20:2014
Semiconductor devices. Micro-electromechanical devices Gyroscopes
SKU/ISBN:9780580774331

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BS EN 62047-21:2014
Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials
SKU/ISBN:9780580775543

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BS EN 62047-22:2014
Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates
SKU/ISBN:9780580775550

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BS EN 62047-16:2015
Semiconductor devices. Micro-electromechanical devices Test methods for determining residual stresses of MEMS films. Wafer curvature and cantilever beam deflection methods
SKU/ISBN:9780580780806

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BS EN 62047-5:2011
Semiconductor devices. Micro-electromechanical devices RF MEMS switches
SKU/ISBN:9780580787690

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BS EN 62047-9:2011
Semiconductor devices. Micro-electromechanical devices Wafer to wafer bonding strength measurement for MEMS
SKU/ISBN:9780580787935

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BS CECC 50000:Supplement No. 1:1983
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices. CECC assessed process average
SKU/ISBN:0580119793

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BS EN 61223-3-1:1999
Evaluation and routine testing in medical imaging departments Acceptance tests
SKU/ISBN:0580327531

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BSI Price (PDF/Printed): £290.00
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BS EN 62047-25:2016
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of pull-press and shearing strength of micro bonding area
SKU/ISBN:9780580856150

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BS EN IEC 62969-3:2018
Semiconductor devices. Semiconductor interface for automotive vehicles Shock driven piezoelectric energy harvesting for automotive vehicle sensors
SKU/ISBN:9780580931888

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BS EN IEC 62969-4:2018
Semiconductor devices. Semiconductor interface for automotive vehicles Evaluation method of data interface for automotive vehicle sensors
SKU/ISBN:9780580931895

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BS EN 60747-16-1:2002+A2:2017
Semiconductor devices Microwave integrated circuits. Amplifiers
SKU/ISBN:9780580876387

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BSI Price (PDF/Printed): £314.00
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BS EN IEC 60747-16-6:2019
Semiconductor devices Microwave integrated circuits. Frequency multipliers
SKU/ISBN:9780580972973

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BS IEC 62047-31:2019
Semiconductor devices. Micro-electromechanical devices Four-point bending test method for interfacial adhesion energy of layered MEMS materials
SKU/ISBN:9780580966606

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BSI Price (PDF/Printed): £150.00
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BS IEC 60747-5-9:2019
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
SKU/ISBN:9780580516238

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BS IEC 62830-6:2019
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices
SKU/ISBN:9780580517501

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BS IEC 60747-5-8:2019
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes
SKU/ISBN:9780580516221

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BS EN 62047-1:2016
Semiconductor devices. Micro-electromechanical devices Terms and definitions
SKU/ISBN:9780580849718

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BS EN 62047-26:2016
Semiconductor devices. Micro-electromechanical devices Description and measurement methods for micro trench and needle structures
SKU/ISBN:9780580853098

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BSI Price (PDF/Printed): £244.00
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BS IEC 63068-2:2019
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method for defects using optical inspection
SKU/ISBN:9780580513749

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BSI Price (PDF/Printed): £198.00
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BS IEC 62830-2:2017
Semiconductor devices. Semiconductor devices for energy harvesting and generation Thermo power based thermoelectric energy harvesting
SKU/ISBN:9780580857539

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BSI Price (PDF/Printed): £142.00
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BS IEC 62951-3:2018
Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation of thin film transistor characteristics on flexible substrates under bulging
SKU/ISBN:9780580972782

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BS EN 62830-3:2017
Semiconductor devices. Semiconductor devices for energy harvesting and generation Vibration based electromagnetic energy harvesting
SKU/ISBN:9780580867927

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BS EN IEC 62969-1:2018
Semiconductor devices. Semiconductor interface for automotive vehicles General requirements of power interface for automotive vehicle sensors
SKU/ISBN:9780580931864

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BS IEC 62047-32:2019
Semiconductor devices. Micro-electromechanical devices Test method for the nonlinear vibration of MEMS resonators
SKU/ISBN:9.78058E+12

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BS IEC 60747-5-11:2019
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of radiative and nonradiative currents of light emitting diodes
SKU/ISBN:9780539032635

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BS IEC 63068-1:2019
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification of defects
SKU/ISBN:9780580964138

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BS EN IEC 62969-2:2018
Semiconductor devices. Semiconductor interface for automotive vehicles Efficiency evaluation methods of wireless power transmission using resonance for automotive vehicles sensors
SKU/ISBN:9780580931871

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BSI Price (PDF/Printed): £142.00
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BS IEC 60747-5-10:2019
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on the room-temperature reference point
SKU/ISBN:9780580516245

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BS IEC 62951-4:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Fatigue evaluation for flexible conductive thin film on the substrate for flexible semiconductor devices
SKU/ISBN:9780580972904

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BS IEC 60747-18-1:2019
Semiconductor devices Semiconductor bio sensors. Test method and data analysis for calibration of lens-free CMOS photonic array sensors
SKU/ISBN:9.78058E+12

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BS IEC 62951-7:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for characterizing the barrier performance of thin film encapsulation for flexible organic semiconductor
SKU/ISBN:9780580966262

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BS IEC 62951-2:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices
SKU/ISBN:9780580972775

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BS IEC 62830-4:2019
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test and evaluation methods for flexible piezoelectric energy harvesting devices
SKU/ISBN:9.78058E+12

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BS IEC 62951-6:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Test method for sheet resistance of flexible conducting films
SKU/ISBN:9780580972935

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BS IEC 62951-1:2017
Semiconductor devices. Flexible and stretchable semiconductor devices Bending test method for conductive thin films on flexible substrates
SKU/ISBN:9780580893124

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BS EN IEC 62384:2020
DC or AC supplied electronic controlgear for LED modules. Performance requirements
SKU/ISBN:9780580946554

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BS IEC 63068-3:2020
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Test method for defects using photoluminescence
SKU/ISBN:9780539021363

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BS IEC 62047-28:2017
Semiconductor devices. Micro-electromechanical devices Performance testing method of vibration-driven MEMS electret energy harvesting devices
SKU/ISBN:9780580901980

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BS IEC 62047-27:2017
Semiconductor devices. Micro-electromechanical devices Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)
SKU/ISBN:9780580899096

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BS IEC 62830-1:2017
Semiconductor devices. Semiconductor devices for energy harvesting and generation Vibration based piezoelectric energy harvesting
SKU/ISBN:9780580857522

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BS EN 60747-16-5:2013+A1:2020
Semiconductor devices Microwave integrated circuits. Oscillators
SKU/ISBN:9780539044539

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BSI Price (PDF/Printed): £276.00
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BS EN IEC 60747-17:2020
Semiconductor devices Magnetic and capacitive coupler for basic and reinforced insulation
SKU/ISBN:9780539168242

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BSI Price (PDF/Printed): £290.00
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BS IEC 62047-35:2019
Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics under bending deformation for flexible electromechanical devices
SKU/ISBN:9780580994951

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BS IEC 60747-5-13:2021
Semiconductor devices Optoelectronic devices. Hydrogen sulphide corrosion test for LED packages
SKU/ISBN:9780539024470

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BS IEC 62047-41:2021
Semiconductor devices. Micro-electromechanical devices RF MEMS circulators and isolators
SKU/ISBN:9780539068931

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PD IEC TS 60747-19-2:2021
Semiconductor devices Smart sensors. Indication of specifications of sensors and power supplies to drive smart sensors for low power operation
SKU/ISBN:9780539056136

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BS IEC 62047-38:2021
Semiconductor devices. Micro-electromechanical devices Test method for adhesion strength of metal powder paste in MEMS interconnection
SKU/ISBN:9780539067514

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BS IEC 62047-40:2021
Semiconductor devices. Micro-electromechanical devices Test methods of micro-electromechanical inertial shock switch threshold
SKU/ISBN:9780539070330

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BS EN IEC 63244-1:2021
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
SKU/ISBN:9780539045826

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BS IEC 62830-8:2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics
SKU/ISBN:9780539048322

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PD IEC TR 60747-5-12:2021
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of LED efficiencies
SKU/ISBN:9780539017076

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BSI Price (PDF/Printed): £314.00
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BS EN IEC 63373:2022
Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
SKU/ISBN:9780539170238

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BS IEC 63068-4:2022
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
SKU/ISBN:9780539184174

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BS IEC 62047-42:2022
Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
SKU/ISBN:9780539165814

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BS IEC 60747-18-5:2023
Semiconductor devices Semiconductor bio sensors. Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light
SKU/ISBN:9780539165807

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BS IEC 63150-1:2019
Semiconductor devices. Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment Arbitrary and random mechanical vibrations
SKU/ISBN:9780580511257

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BS IEC 60747-5-16:2023
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
SKU/ISBN:9780539185416

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BS IEC 62830-7:2021
Semiconductor devices. Semiconductor devices for energy harvesting and generation Linear sliding mode triboelectric energy harvesting
SKU/ISBN:9780539017465

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BS IEC 62047-43:2024
Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices
SKU/ISBN:9780539176650

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