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BS EN IEC 63373:2022 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices

Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices

BS EN IEC 63373:2022

Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices


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ISBN: 9780539170238

Keywords:
Electronic equipment and components, Transistors, Power transistors, Semiconductor devices, Test methods, PDF
Publication Date17 Jun 2022
Product SKU30434333
ISBN9780539170238
BSI CodeBS EN IEC 63373:2022
No. of pages20
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 63373 Ed.1.0
  • IEC 63373 Ed.1.0




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