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BS EN 62047-2:2006 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Semiconductor devices. Micro-electromechanical devices Tensile testing method of thin film materials

Semiconductor devices. Micro-electromechanical devices Tensile testing method of thin film materials

BS EN 62047-2:2006

Semiconductor devices. Micro-electromechanical devices Tensile testing method of thin film materials


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ISBN: 0580497402

Keywords:
Integrated circuits, Thin films, Test equipment, Tensile testing, Electronic equipment and components, Electromechanical devices, Semiconductor technology, Semiconductor devices, Test specimens, PDF
Publication Date30 Nov 2006
Product SKU30098052
ISBN0580497402
BSI CodeBS EN 62047-2:2006
No. of pages16
PublisherBritish Standards Institution
Identical National Standard to:
  • EN 60317-0-5:1994/A2:2000
  • EN 62047-2:2006
  • IEC 62047-2:2006




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