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BS IEC 62047-43:2024 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices

Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices

BS IEC 62047-43:2024

Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices


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ISBN: 9780539176650

Keywords:
Semiconductor manufacture, Semiconductor technology, Electromechanical storage, Bend testing, Testing methods, Characteristics, Performance characteristics, PDF
Publication Date22 Mar 2024
Product SKU30437196
ISBN9780539176650
BSI CodeBS IEC 62047-43:2024
No. of pages22
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-43 Ed.1.0




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