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BS EN 62047-22:2014 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates

Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates

BS EN 62047-22:2014

Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates


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ISBN: 9780580775550

Keywords:
Thin-film devices, Semiconductor technology, Semiconductor devices, Electromechanical devices, Electronic equipment and components, Test equipment, Fatigue testing, Resonance, Integrated circuits, Test specimens, Bend testing, Vibration, PDF
Publication Date31 Oct 2014
Product SKU30257244
ISBN9780580775550
BSI CodeBS EN 62047-22:2014
No. of pages14
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-22:2014
  • EN 62047-22:2014




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