BS EN 62047-6:2010 | British Standards

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Semiconductor devices. Micro-electromechanical devices Axial fatigue testing methods of thin film materials

BS EN 62047-6:2010

Semiconductor devices. Micro-electromechanical devices Axial fatigue testing methods of thin film materials

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ISBN: 9780580585449

Keywords:
Integrated circuits, Tensile testing, Thin films, Test specimens, Fatigue testing, Semiconductor devices, Test equipment, Semiconductor technology, Electromechanical devices, Axial stress, Electronic equipment and components, PDF

Publication Date	30 Apr 2010
Product SKU	30163303
ISBN	9780580585449
BSI Code	BS EN 62047-6:2010
No. of pages	20
Publisher	British Standards Institution

Identical National Standard to:

IEC 62047-6:2009
EN 62047-6:2010
EN 62149-6:2003

BS EN 62047-6:2010 | British Standards

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