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British Standards for 31.080.99 Other semiconductor devices | Module: ICS 31.080.99

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

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BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
SKU/ISBN:058016263X

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BS IEC 60747-14-2:2000
Discrete semiconductor devices and integrated circuits. Semiconductor devices. Semiconductor sensors Hall elements
SKU/ISBN:0580373134

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BS EN 60512-2-6:2002
Connectors for electronic equipment. Tests and measurements. Electrical continuity and contact resistance tests Test 2f. Housing (shell) electrical continuity
SKU/ISBN:0580396703

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BS EN 60146-2:2000
Semiconductor convertors. General requirements and line commutated convertors Self-commutated semiconductor converters including direct d.c. converters
SKU/ISBN:0580362639

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BS EN 60747-5-2:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Essential ratings and characteristics
SKU/ISBN:0580291448

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BS EN 60747-5-3:2001
Discrete semiconductor devices and integrated circuits. Optoelectronic devices Measuring methods
SKU/ISBN:0580291456

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BS EN 62047-2:2006
Semiconductor devices. Micro-electromechanical devices Tensile testing method of thin film materials
SKU/ISBN:0580497402

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BS EN 61967-2:2005
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method
SKU/ISBN:0580474763

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BS EN 62374:2007
Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
SKU/ISBN:9780580540486

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BS EN 62047-3:2006
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
SKU/ISBN:0580497410

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BS EN 62258-5:2006
Semiconductor die products Requirements for information concerning electrical simulation
SKU/ISBN:0580496082

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BS EN 62258-6:2006
Semiconductor die products Requirements for information concerning thermal simulation
SKU/ISBN:0580496090

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BS EN 62047-4:2010
Semiconductor devices. Micro-electromechanical devices Generic specification for MEMS
SKU/ISBN:9780580568572

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PD IEC/TR 62258-7:2007
Semiconductor die products XML schema for data exchange
SKU/ISBN:9780580582677

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BS EN 60464-2:2001
Varnishes used for electrical insulation Methods of test
SKU/ISBN:0580387542

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BS EN 62047-6:2010
Semiconductor devices. Micro-electromechanical devices Axial fatigue testing methods of thin film materials
SKU/ISBN:9780580585449

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BS EN 62258-1:2010
Semiconductor die products Procurement and use
SKU/ISBN:9780580591105

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PD IEC/TR 62258-8:2008
Semiconductor die products EXPRESS model schema for data exchange
SKU/ISBN:9780580604522

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BS EN 62047-7:2011
Semiconductor devices. Micro-electromechanical devices MEMS BAW filter and duplexer for radio frequency control and selection
SKU/ISBN:9780580606281

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BS EN 62047-8:2011
Semiconductor devices. Micro-electromechanical devices Strip bending test method for tensile property measurement of thin films
SKU/ISBN:9780580606298

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BS EN 62258-2:2011
Semiconductor die products Exchange data formats
SKU/ISBN:9780580618925

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BS IEC 60747-14-3:2009
Semiconductor devices Semiconductor sensors. Pressure sensors
SKU/ISBN:9780580629013

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BS EN 62047-10:2011
Semiconductor devices. Micro-electromechanical devices Micro-pillar compression test for MEMS materials
SKU/ISBN:9780580694479

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BS EN 62047-11:2013
Semiconductor devices. Micro-electromechanical devices Test method for coefficients of linear thermal expansion of free-standing materials for micro-electromechanical systems
SKU/ISBN:9780580694486

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BS EN 62047-13:2012
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
SKU/ISBN:9780580694509

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BS EN 62047-15:2015
Semiconductor devices. Micro-electromechanical devices Test method of bonding strength between PDMS and glass
SKU/ISBN:9780580708022

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BS EN 62047-18:2013
Semiconductor devices. Micro-electromechanical devices Bend testing methods of thin film materials
SKU/ISBN:9780580720116

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BS EN 62047-17:2015
Semiconductor devices. Micro-electromechanical devices Bulge test method for measuring mechanical properties of thin films
SKU/ISBN:9780580722035

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BS EN 62047-14:2012
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
SKU/ISBN:9780580722974

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PD CLC/TR 62258-4:2013
Semiconductor die products Questionnaire for die users and suppliers
SKU/ISBN:9780580729010

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BS EN 62047-12:2011
Semiconductor devices. Micro-electromechanical devices Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
SKU/ISBN:9780580763014

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BS EN 62047-19:2013
Semiconductor devices. Micro-electromechanical devices Electronic compasses
SKU/ISBN:9780580759376

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BS EN 62047-20:2014
Semiconductor devices. Micro-electromechanical devices Gyroscopes
SKU/ISBN:9780580774331

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BS EN 62047-21:2014
Semiconductor devices. Micro-electromechanical devices Test method for Poisson's ratio of thin film MEMS materials
SKU/ISBN:9780580775543

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BS EN 62047-22:2014
Semiconductor devices. Micro-electromechanical devices Electromechanical tensile test method for conductive thin films on flexible substrates
SKU/ISBN:9780580775550

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BS EN 62047-16:2015
Semiconductor devices. Micro-electromechanical devices Test methods for determining residual stresses of MEMS films. Wafer curvature and cantilever beam deflection methods
SKU/ISBN:9780580780806

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BS EN 62047-5:2011
Semiconductor devices. Micro-electromechanical devices RF MEMS switches
SKU/ISBN:9780580787690

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BS EN 62047-9:2011
Semiconductor devices. Micro-electromechanical devices Wafer to wafer bonding strength measurement for MEMS
SKU/ISBN:9780580787935

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BS CECC 50000:Supplement No. 1:1983
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices. CECC assessed process average
SKU/ISBN:0580119793

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BS EN 61223-3-1:1999
Evaluation and routine testing in medical imaging departments Acceptance tests
SKU/ISBN:0580327531

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BS EN 62047-25:2016
Semiconductor devices. Micro-electromechanical devices Silicon based MEMS fabrication technology. Measurement method of pull-press and shearing strength of micro bonding area
SKU/ISBN:9780580856150

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BS EN IEC 62969-3:2018
Semiconductor devices. Semiconductor interface for automotive vehicles Shock driven piezoelectric energy harvesting for automotive vehicle sensors
SKU/ISBN:9780580931888

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BS EN IEC 62969-4:2018
Semiconductor devices. Semiconductor interface for automotive vehicles Evaluation method of data interface for automotive vehicle sensors
SKU/ISBN:9780580931895

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BS EN 60747-16-1:2002+A2:2017
Semiconductor devices Microwave integrated circuits. Amplifiers
SKU/ISBN:9780580876387

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BS EN IEC 60747-16-6:2019
Semiconductor devices Microwave integrated circuits. Frequency multipliers
SKU/ISBN:9780580972973

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BS IEC 62047-31:2019
Semiconductor devices. Micro-electromechanical devices Four-point bending test method for interfacial adhesion energy of layered MEMS materials
SKU/ISBN:9780580966606

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BS IEC 60747-5-9:2019
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence
SKU/ISBN:9780580516238

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BS IEC 62830-6:2019
Semiconductor devices. Semiconductor devices for energy harvesting and generation Test and evaluation methods for vertical contact mode triboelectric energy harvesting devices
SKU/ISBN:9780580517501

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BS IEC 60747-5-8:2019
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes
SKU/ISBN:9780580516221

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BS EN 62047-1:2016
Semiconductor devices. Micro-electromechanical devices Terms and definitions
SKU/ISBN:9780580849718

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Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

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