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BS IEC 62047-42:2022 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever

Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever

BS IEC 62047-42:2022

Semiconductor devices. Micro-electromechanical devices Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever


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ISBN: 9780539165814

Keywords:
Semiconductor technology, Electronic equipment and components, Semiconductor devices, Semiconductors, Semiconductor diodes, Semiconductor rectifiers, Semiconductor resistors, PDF
Publication Date24 Oct 2022
Product SKU30432243
ISBN9780539165814
BSI CodeBS IEC 62047-42:2022
No. of pages24
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-42:2022 ED1




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