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BS IEC 62047-32:2019 | British Standards

Standards Shop | ICS 31 | ICS 31.080 |  ICS 31.080.99

31.080.99 Other semiconductor devices

Semiconductor devices. Micro-electromechanical devices Test method for the nonlinear vibration of MEMS resonators

Semiconductor devices. Micro-electromechanical devices Test method for the nonlinear vibration of MEMS resonators

BS IEC 62047-32:2019

Semiconductor devices. Micro-electromechanical devices Test method for the nonlinear vibration of MEMS resonators


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ISBN: 9780580973895

Keywords:
Terminology, Semiconductor devices, Vocabulary, Semiconductor technology, Electromechanical devices, Electronic equipment and components, Integrated circuits, PDF
Publication Date29 Jan 2019
Product SKU30355769
ISBN9780580973895
BSI CodeBS IEC 62047-32:2019
No. of pages22
PublisherBritish Standards Institution
Identical National Standard to:
  • IEC 62047-32:2019




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